HIGHLEVEL
Griffin III Hybrid
The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features in a single system, at the lowest cost. For devices requiring DC and Continuity test capability only, G3H is a very flexible cost-effective Production Test solution. This approach provides a DC test system with the capability to add logic resources (AC/SCAN) as well as analog resources for Mixed Signal. The HILEVEL G3H embraces low cost while supporting SCAN, giving you the ability to toggle every node in your chip.
Features :
- Test rates up to 200MHz (100MHz All Modes)
- Eight high-speed clocks up to 500MHz with compliment outputs
- Two strobes per cycle
- Up to 1,024 DC pins
- Up to 128 AC/DC logic pins
- Up to 40 DUT power supplies for Multi-site testing
- Real-time failure counter
- Display “capture fails only” mode
- High-speed acquisition search
- Full “next cycle” operation
- Scan up to 128 chains, up to 8Gbit
- 64Meg test vector depth and capture depth
- Programmable loads and parallel loads
- Multiple high-precision DC PMU units
- Timing On-the-Fly
- Mixed Signal Option with MX2
