Focused Test, Inc. (FTI)
FTI 1000 Tester
Focused Test, Inc. (FTI)
Test Head and TMU test systems are based on a ‘Tester-per-Channel’ design which uses the USB bus to allow easy system scalability for multisite applications.
FTI testers can be easily configured to perform parallel tests with many different types of multisite handlers, including gravity, turret, strip and wafer ring handlers.
The FTI 1000 tester consists of independent test channels that allow all DC and AC MOSFET parameters to be tested either separately, or in one handler insertion or prober touch-down.
Features
Open-Source Software Architecture:
- Full access to Test Function Library ‘C’ Code
Scalability:
- Lower capital cost
- Higher Throughput
Flexible Configurations:
- Higher Handler Productivity
- Multisite Test of CSP Packages
- Multidie Test for Wafer Probing
- High Voltage IC Test Capability
Focused Technology:
- Integrated DC+AC Discrete test
- Floating Power Instruments
- Lowest Cost of Test per Device
