HIGHLEVEL
Griffin III
The Griffin III system brings new price/performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987.
The Griffin III system brings new price/performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987. This tester is a superior cost-effective solution for Engineering, Production, and Failure Analysis test applications.
Features :
- Test rates up to 200MHz (100MHz All Modes)
- Eight high-speed clocks up to 500MHz with compliment outputs
- Two strobes per cycle
- Up to 512 logic pins in ONE Chassis
- Real-time failure counter
- Display “capture fails only” mode
- High-speed acquisition search
- Full “next cycle” operation
- Scan up to 128 chains, up to 8Gbit
- 64Meg test vector depth and capture depth
- Programmable loads and parallel loads
- Multiple high-precision DC PMU units
- Timing On-the-Fly
- Mixed Signal Option with MX2
