Control Automation Technology (CAT)

CONTROL AUTOMATION TECHNOLOGY

HILEVEL TECHNOLOGY

Our high-performance chip testers serve Multi-Site Production, Design Verification, Single Event Effects, Mixed Signal, Memory Test, and Failure Analysis applications at an amazingly low cost.
CURVEMASTER

The CurveMasterTM delivers new price/performance efficiency to curve tracing and Failure Analysis. Curve trace has been a standard feature in our full-power.

DC3

No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins,

ETS788

The 55/110 MHz ETS788 system boasts the same small footprint and cool quiet CMOS architecture as our ETS780 but with the new high-performance precision

ETS880 TITAN

In 1986, HiLevel boldly created the industry’s first “tester-in-a-head”, the TOPAZ-V. Now we’re introducing the ETS880 TITAN, taking the TOPAZ-V legacy further

GRIFFIN III

The all new Griffin III is a redesigned powerhouse, loaded with features For fast throughput with DC and SCAN test only, consider the Griffin III Hybrid, introduced by HILEVEL in 1987..

GRIFFIN III HYBRID

The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features

GRIFFIN SEE-RAD

The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the latest technology