Our high-performance chip testers serve Multi-Site Production, Design Verification, Single Event Effects, Mixed Signal, Memory Test, and Failure Analysis applications at an amazingly low cost.
CURVEMASTER
The CurveMasterTM delivers new price/performance efficiency to curve tracing and Failure Analysis. Curve trace has been a standard feature in our full-power.
No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins,
The 55/110 MHz ETS788 system boasts the same small footprint and cool quiet CMOS architecture as our ETS780 but with the new high-performance precision
In 1986, HiLevel boldly created the industry’s first “tester-in-a-head”, the TOPAZ-V. Now we’re introducing the ETS880 TITAN, taking the TOPAZ-V legacy further
The all new Griffin III is a redesigned powerhouse, loaded with features For fast throughput with DC and SCAN test only, consider the Griffin III Hybrid, introduced by HILEVEL in 1987..
The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the latest technology